COMPONENT AND QUALIFICATION SERVICES

Expertise in the full spectrum of qualification services required to maintain a high parts pedigree. Our component test and qualification services are offered on a contract basis and can be tailored to your specific needs.
The following services are provided as either full turn-key Component Qualification & Supply Chain Management coverage or on an a la carte basis:
- BOM Analysis, Qualification Risk Assessment, and alternate part recommendations
- Worst Case Circuit Analysis (WCCA)
- Component procurement, tracking, and storage with die-level trace-ability
- Component source inspection and auditing
- Dry nitrogen humidity, temperature, and access controlled storage
- Customer die and component banking with just-in-time delivery
- Receiving and quality conformance inspection
- Counterfeit analysis and tamper detection
- Component repackaging and construction analysis
- Prohibited materials screening (RHOS, Cadmium, Tin, unplated brass, etc.)
- Destructive physical analysis (DPA)
- Confocal Scanning Acoustic Microscopy (CASM)
- X-ray analysis
- Highly Accelerated Stress Testing (HAST)
- High Temperature Operating Life (HTOL) testing
- Temperature cycling and dynamic burn-in
- Electrostatic Discharge (ESD) testing and analysis
- Physics of failure assessment
- Radiation Lot Assessment Testing (RLAT)
- Total Ionizing Dose (TID) testing
- Enhanced Low Dose Rate Sensitivity (ELDRS) testing
- Displacement Damage Dose (DDD) testing
- Prompt dose testing
- Destructive Single-Event Latch-up (SEL) testing
- Single-Event Gate Rupture (SEGR) testing
- Non-destructive proton, heavy-ion, neutron Single-Event Effect (SEE) testing
- Test plan, fixture, board, and setup development
The Qualification Process
All aspects of the qualification process are performed using customer-directed industry standard procedures with complete requirements traceability and tracking, and full customer transparency.
We reduce your parts procurement, qualification, and storage overhead by providing a single interface to a wide range of subcontracted services. Our rigorous component test, analysis, and handling standards meet those required by our most stringent, risk-averse customers.
Leveraging a foundation a high level of quality, we also provide a cost-effective means to improve system reliability for commercial and smallsat missions while demystifying the qualification process for customers new to space electronics qualification.
We maintain the expertise to test a wide range of simple and complex components including:
- Single and multi-core processors including GPUs, DSPs, FPGAs
- Complex System-on-Chip (SoC) processors including associated peripherals
- Microcontrollers
- Volatile memory including SRAM, and DDR/DDR2/DDR3/DDR4 SDRAM
- Non-volatile memory including EEPROM, Flash, FRAM, and MRAM
- Digital-to-Analog Converters (DACs) and Analog-to-Digital Converters (ADCs)
- Metal Oxide Semiconductor Field Effect Transistors (MOSFETs)
- Bi-polar Junction (BJT) transistors
- Oscillators, clock buffers, and clock distribution components
- Optical components
- And many others
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