Component and Qualification Services


Expertise in the full spectrum of qualification services required to maintain a high parts pedigree. Our component test and qualification services are offered on a contract basis and can be tailored to your specific needs.

The following services are provided as either full turn-key Component Qualification & Supply Chain Management coverage or on an a la carte basis:

  • BOM Analysis, Qualification Risk Assessment, and alternate part recommendations
  • Worst Case Circuit Analysis (WCCA)
  • Component procurement, tracking, and storage with die-level trace-ability
  • Component source inspection and auditing
  • Dry nitrogen humidity, temperature, and access controlled storage
  • Customer die and component banking with just-in-time delivery
  • Receiving and quality conformance inspection
  • Counterfeit analysis and tamper detection
  • Component repackaging and construction analysis
  • Prohibited materials screening (RHOS, Cadmium, Tin, unplated brass, etc.)
  • Destructive physical analysis (DPA)
  • Confocal Scanning Acoustic Microscopy (CASM)
  • X-ray analysis
  • Highly Accelerated Stress Testing (HAST)
  • High Temperature Operating Life (HTOL) testing
  • Temperature cycling and dynamic burn-in
  • Electrostatic Discharge (ESD) testing and analysis
  • Physics of failure assessment
  • Radiation Lot Assessment Testing (RLAT)
  • Total Ionizing Dose (TID) testing
  • Enhanced Low Dose Rate Sensitivity (ELDRS) testing
  • Displacement Damage Dose (DDD) testing
  • Prompt dose testing
  • Destructive Single-Event Latch-up (SEL) testing
  • Single-Event Gate Rupture (SEGR) testing
  • Non-destructive proton, heavy-ion, neutron Single-Event Effect (SEE) testing
  • Test plan, fixture, board, and setup development

The Qualification Process

All aspects of the qualification process are performed using customer-directed industry standard procedures with complete requirements traceability and tracking, and full customer transparency.

We reduce your parts procurement, qualification, and storage overhead by providing a single interface to a wide range of subcontracted services. Our rigorous component test, analysis, and handling standards meet those required by our most stringent, risk-averse customers.

Leveraging a foundation a high level of quality, we also provide a cost-effective means to improve system reliability for commercial and smallsat missions while demystifying the qualification process for customers new to space electronics qualification.

We maintain the expertise to test a wide range of simple and complex components including:

  • Single and multi-core processors including GPUs, DSPs, FPGAs
  • Complex System-on-Chip (SoC) processors including associated peripherals
  • Microcontrollers
  • Volatile memory including SRAM, and DDR/DDR2/DDR3/DDR4 SDRAM
  • Non-volatile memory including EEPROM, Flash, FRAM, and MRAM
  • Digital-to-Analog Converters (DACs) and Analog-to-Digital Converters (ADCs)
  • Metal Oxide Semiconductor Field Effect Transistors (MOSFETs)
  • Bi-polar Junction (BJT) transistors
  • Oscillators, clock buffers, and clock distribution components
  • Optical components
  • And many others

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